Tech Xplore on MSN

AI-driven smart jig can detect micro-level defects in just 2.79 seconds

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that ...
pv magazine International

Ensemble deep learning for PV cell defect detection

Researchers have tested eight stand-alone deep learning methods for PV cell fault detection and have found that their accuracy was as high as 73%. All methods were trained and tested on the ELPV ...
Semiconductor Engineering

Identifying PCB Defects with a Deep Learning Single-Step Detection Model

This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...